Materials Characterization

X-RAY DIFFRACTION(XRD)

X-ray diffraction (XRD) is used for the primary characterization of material properties like crystal structure, crystallite size, and strain.

FIELD EMISSION SCANNING ELECTRON MICROSCOPY(FESEM)

Is used to investigate the morphology (e.g., particle sizes and shapes), metallographic details, imperfections, and topology of nanocrystalline powders and bulk materials.

TRANSMISSION ELECTRON MICROSCOPY(TEM)

The transmission electron microscope is used to view thin specimens (tissue sections, molecules, etc) through which electrons can pass generating a projection image. TEM can be used to study the growth of layers, their composition and defects in
semiconductors.

VIBRATING SAMPLE MAGNETO-METRIC ANALYSIS(VSM)

The vibrating sample magnetometer has become a widely used instrument for determining magnetic properties of a large variety of materials: diamagnetics, paramagnetics, ferromagnetics, ferromagnetics and antiferromagnetics.

THERMOGRAVIMETRIC ANALYSIS(TGA)

Thermogravimetric analysis (TGA) is an analytical technique used to determine a material’s thermal stability and its fraction of volatile components by monitoring the weight change that occurs as a sample is heated at a constant rate.

We also assit in other material characterizations such as XPS, squid, 4 probe measurement, etc Let us know which material characterization you need.